65 FR 61 pg. 16563 - University of Michigan; Notice of Decision on Application for Duty-Free Entry of Electron Microscope
Type: NOTICEVolume: 65Number: 61Page: 16563
FR document: [FR Doc. 00-7763 Filed 3-28-00; 8:45 am]
Agency: Commerce Department
Sub Agency: International Trade Administration
Official PDF Version: PDF Version
DEPARTMENT OF COMMERCE
International Trade Administration
University of Michigan; Notice of Decision on Application for Duty-Free Entry of Electron Microscope
This is a decision pursuant to section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-651, 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5:00 p.m. in Room 4211, U.S. Department of Commerce, 14th and Constitution Avenue, NW., Washington, DC.
Docket Number: 00-002. Applicant: The Regents of the University of Michigan, Ann Arbor, MI 48109-2143. Instrument: Electron Microscope, Model JEM-2010F. Manufacturer: JEOL Ltd., Japan. Intended Use: See notice at 65 FR 11986, March 7, 2000. Order Date: April 22, 1999.
Comments: None received. Decision : Approved. No instrument of equivalent scientific value to the foreign instrument, for such purposes as the instrument is intended to be used, was being manufactured in the United States at the time the instrument was ordered. Reasons : The foreign instrument is a conventional transmission electron microscope (CTEM) and is intended for research or scientific educational uses requiring a CTEM. We know of no CTEM, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of the instrument.
Frank W. Creel,
Director, Statutory Import Programs Staff.
[FR Doc. 00-7763 Filed 3-28-00; 8:45 am]
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